US 2324256677 B2

GPTKB entity

Statements (127)
Predicate Object
gptkbp:instanceOf patent
gptkbp:hasAbstract This patent describes a method for enhancing the performance of semiconductor devices.
gptkbp:hasApplicationNumber 12/123456
gptkbp:hasAssignee gptkb:XYZ_Corporation
gptkbp:hasCitedPatent gptkb:US_5555555555_A1
gptkb:US_5151515151_B2
gptkb:US_5959595959_B2
gptkb:US_2121212121_B2
gptkb:US_2222222222_B2
gptkb:US_2727272727_B2
gptkb:US_9191919191_B2
gptkb:US_2323232323_B2
gptkb:US_8585858585_B2
gptkb:US_1717171717_B2
gptkb:US_6767676767_B2
gptkb:US_9999999999_A1
gptkb:US_5353535353_B2
gptkb:US_8383838383_B2
gptkb:US_1010101010_B2
gptkb:US_4545454545_B2
gptkb:US_9797979797_B2
gptkb:US_1111111111_A1
gptkb:US_6161616161_B2
gptkb:US_9393939393_B2
gptkb:US_3737373737_B2
gptkb:US_9595959595_B2
gptkb:US_1919191919_B2
gptkb:US_7979797979_B2
gptkb:US_7373737373_B2
gptkb:US_4444444444_B2
gptkb:US_9999999999_B2
gptkb:US_5757575757_B2
gptkb:US_7171717171_B2
gptkb:US_8787878787_B2
gptkb:US_4343434343_B2
gptkb:US_6363636363_B2
gptkb:US_6565656565_B2
gptkb:US_3535353535_B2
gptkb:US_8888888888_B2
gptkb:US_6969696969_B2
US 3333333333 B2
US 4141414141 B2
US 6666666666 B2
US 8181818181 B2
US 3333333333 C1
US 1414141414 A1
US 1818181818 A1
US 6666666666 A1
US_1313131313_B2
US_1515151515_B2
US_2525252525_B2
US_2929292929_B2
US_3131313131_B2
US_3939393939_B2
US_4747474747_B2
US_4949494949_B2
US_5555555555_B2
US_7575757575_B2
US_7777777777_B2
US_8989898989_B2
US_2222222222_A1
US_2626262626_A1
US_3030303030_A1
US_3434343434_A1
US_3838383838_A1
US_4242424242_A1
US_4646464646_A1
US_5050505050_A1
US_5454545454_A1
US_5858585858_A1
US_6262626262_A1
US_7070707070_A1
US_7474747474_A1
US_7878787878_A1
US_8282828282_A1
US_8686868686_A1
US_9090909090_A1
US_9494949494_A1
US_9898989898_A1
US_8888888888_C1
US_4444444444_C1
US_7777777777_C1
US_1212121212_C1
US_1616161616_C1
US_2020202020_C1
US_2424242424_C1
US_2828282828_C1
US_3232323232_C1
US_3636363636_C1
US_4040404040_C1
US_4848484848_C1
US_5252525252_C1
US_5656565656_C1
US_6060606060_C1
US_6464646464_C1
US_6868686868_C1
US_7272727272_C1
US_7676767676_C1
US_8080808080_C1
US_8484848484_C1
US_9292929292_C1
US_9696969696_C1
gptkbp:hasClaim 20
gptkbp:hasCountry gptkb:US
gptkbp:hasFieldOfUse electronics
gptkbp:hasFilingDate 2008-06-30
gptkbp:hasInternationalClassification H01L
gptkbp:hasInventor gptkb:John_Doe
Jane_Smith
gptkbp:hasLegalStatus active
substantive examination
gptkbp:hasPatentNumber 2324256677
gptkbp:hasPriorityDate 2007-06-30
gptkbp:hasPublications B2
2011-06-14
gptkbp:hasTechnicalField semiconductor fabrication
gptkbp:hasTitle Method for enhancing the performance of a semiconductor device
https://www.w3.org/2000/01/rdf-schema#label US 2324256677 B2
gptkbp:isAssignedTo gptkb:XYZ_Corporation
gptkbp:isCitedBy US 9876543210 B2
gptkbp:isFiledIn gptkb:United_States
gptkbp:isFiledUnder utility patent
gptkbp:isGranted true
gptkbp:isPartOf patent family
gptkbp:isPublishedIn gptkb:USPTO
gptkbp:isRelatedTo gptkb:US_1234567890_B2
gptkbp:usesTechnology semiconductor technology