Statements (63)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:software
|
| gptkbp:bfsLayer |
7
|
| gptkbp:bfsParent |
gptkb:Synopsys_Semiconductor_Group
|
| gptkbp:aims_to |
reduce test costs
|
| gptkbp:can_create |
test vectors
|
| gptkbp:category |
gptkb:museum
|
| gptkbp:developed_by |
gptkb:Synopsys
customer feedback high volume manufacturing |
| gptkbp:enhances |
design for testability
|
| gptkbp:features |
user-friendly interface
|
| https://www.w3.org/2000/01/rdf-schema#label |
Tetra MAX
|
| gptkbp:improves |
test coverage
|
| gptkbp:includes |
debugging features
|
| gptkbp:integrates_with |
other Synopsys tools
|
| gptkbp:is_available_for |
various operating systems
|
| gptkbp:is_available_on |
cloud platforms
subscription model |
| gptkbp:is_compatible_with |
legacy systems
FPGA designs various simulators multiple design environments |
| gptkbp:is_designed_for |
digital circuits
|
| gptkbp:is_designed_to |
streamline testing process
|
| gptkbp:is_integrated_with |
AI technologies
continuous integration systems |
| gptkbp:is_known_for |
high performance
reduce time to market enhance productivity |
| gptkbp:is_optimized_for |
low power designs
|
| gptkbp:is_part_of |
quality assurance process
test strategy test and measurement solutions design verification process Synopsys DSO.ai Synopsys product suite |
| gptkbp:is_recognized_by |
industry standard
|
| gptkbp:is_recognized_for |
innovation in testing
|
| gptkbp:is_supported_by |
gptkb:document
training resources |
| gptkbp:is_used_by |
semiconductor companies
|
| gptkbp:is_used_for |
ASIC testing
|
| gptkbp:is_used_in |
automotive applications
|
| gptkbp:is_used_to |
validate designs
improve yield |
| gptkbp:is_utilized_in |
gptkb:aircraft
gptkb:Telecommunications_company safety-critical applications consumer electronics manufacturers |
| gptkbp:offers |
customization options
real-time analysis automatic test pattern generation |
| gptkbp:provides |
collaboration tools
report generation tools design analysis tools test pattern generation |
| gptkbp:purpose |
Test generation
|
| gptkbp:released_in |
2000s
|
| gptkbp:supports |
multiple languages
multi-site testing scan-based testing |
| gptkbp:uses |
fault simulation
|
| gptkbp:utilizes |
advanced algorithms
|