Statements (18)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
probe station
|
| gptkbp:application |
failure analysis
DC measurements RF measurements parametric testing |
| gptkbp:compatibleWith |
various probe cards
|
| gptkbp:feature |
high precision positioning
manual and semi-automatic operation microscope integration temperature control options |
| https://www.w3.org/2000/01/rdf-schema#label |
SUMMIT probe station
|
| gptkbp:manufacturer |
gptkb:Cascade_Microtech
|
| gptkbp:marketedAs |
semiconductor industry
research laboratories |
| gptkbp:usedFor |
device characterization
semiconductor wafer testing |
| gptkbp:bfsParent |
gptkb:Cascade_Microtech
|
| gptkbp:bfsLayer |
8
|