Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:Applied_Materials
|
| gptkbp:acquisitionYear |
1997
|
| gptkbp:foundedIn |
gptkb:Israel
|
| gptkbp:foundedYear |
1979
|
| gptkbp:headquartersLocation |
gptkb:Rehovot,_Israel
|
| https://www.w3.org/2000/01/rdf-schema#label |
Orbot Instruments
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:notableFor |
pioneering automated optical inspection
|
| gptkbp:product |
metrology equipment
wafer inspection systems |
| gptkbp:bfsParent |
gptkb:Applied_Materials
|
| gptkbp:bfsLayer |
6
|