Statements (53)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Research_Institute
|
| gptkbp:assists |
test strategy development
|
| gptkbp:developedBy |
gptkb:Cadence_Design_Systems
|
| gptkbp:enables |
design verification
fault coverage optimization |
| gptkbp:enhances |
design reliability
design productivity |
| gptkbp:facilitates |
design rule checks
|
| https://www.w3.org/2000/01/rdf-schema#label |
OrCAD DFT
|
| gptkbp:improves |
manufacturing yield
|
| gptkbp:includes |
automatic test pattern generation
|
| gptkbp:integratesWith |
gptkb:OrCAD_PCB_Designer
|
| gptkbp:isAvailableIn |
cloud-based versions
on-premises versions Windows platform |
| gptkbp:isCompatibleWith |
FPGA designs
ASIC_designs multiple_EDA_tools |
| gptkbp:isIntegratedWith |
simulation tools
|
| gptkbp:isKnownFor |
high accuracy
|
| gptkbp:isPartOf |
OrCAD suite
Cadence_DFT_solutions DFT_best_practices DFT_flow |
| gptkbp:isRecognizedFor |
enhancing product quality
cost reduction in testing improving test efficiency streamlining production processes |
| gptkbp:isSupportedBy |
customer support services
technical documentation |
| gptkbp:isUsedBy |
design engineers
|
| gptkbp:isUsedIn |
semiconductor industry
|
| gptkbp:isUtilizedIn |
telecommunications
consumer electronics medical devices aerospace applications automotive electronics |
| gptkbp:offers |
user-friendly interface
customizable test solutions DFT_architecture_planning |
| gptkbp:provides |
debugging capabilities
real-time analysis report generation tools design optimization features testability analysis |
| gptkbp:reduces |
test time
|
| gptkbp:supports |
multiple design formats
test coverage analysis JTAG testing boundary scan scan design |
| gptkbp:usedFor |
integrated circuit testing
|
| gptkbp:utilizes |
DFT_methodologies
|