Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scanning transmission electron microscope
|
| https://www.w3.org/2000/01/rdf-schema#label |
Nion UltraSTEM
|
| gptkbp:introducedIn |
2000s
|
| gptkbp:location |
various research institutions worldwide
|
| gptkbp:manufacturer |
Nion Company
|
| gptkbp:notableFeature |
aberration correction
sub-angstrom resolution |
| gptkbp:operatingSystem |
60-200 kV
|
| gptkbp:usedFor |
materials science research
electron energy loss spectroscopy atomic-resolution imaging |
| gptkbp:bfsParent |
gptkb:Nion
|
| gptkbp:bfsLayer |
6
|