Next-Generation X-ray Reflectometer
GPTKB entity
Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scientific instrument
|
| gptkbp:analyzes |
reflected X-ray intensity
|
| gptkbp:category |
gptkb:research_institute
|
| https://www.w3.org/2000/01/rdf-schema#label |
Next-Generation X-ray Reflectometer
|
| gptkbp:measures |
surface roughness
density profiles film thickness |
| gptkbp:usedFor |
X-ray reflectometry
|
| gptkbp:usedIn |
materials science
thin film analysis |
| gptkbp:uses |
gptkb:X-rays
|
| gptkbp:bfsParent |
gptkb:NXR
|
| gptkbp:bfsLayer |
8
|