NMOS

GPTKB entity

Statements (69)
Predicate Object
gptkbp:instance_of gptkb:Company
gptkbp:bfsLayer 5
gptkbp:bfsParent gptkb:TMS_9995
gptkb:Intel_8088
gptkb:MOS_Technology_8502
gptkbp:application analog circuits
digital circuits
gptkbp:arrangements common drain
common gate
common source
gptkbp:average_temperature positive
gptkbp:benefits high speed
low power consumption
higher leakage current compared to PMOS
gptkbp:body_style influences threshold voltage
gptkbp:construction_material polysilicon
gptkbp:distributor electrons
https://www.w3.org/2000/01/rdf-schema#label NMOS
gptkbp:legal_issue enhancement mode
gptkbp:material p-type
gptkbp:orbital_period gptkb:political_organization
performance metrics
availability
environmental impact
market demand
power efficiency
scalability
signal integrity
design rules
cost
failure analysis
thermal stability
testing procedures
simulation models
thermal resistance
lifetime
gate charge
maximum gate-source voltage
design complexity
device reliability
gate capacitance
on-resistance
transconductance
characterization methods
switching speed
electrical characteristics
layout considerations
transistor size
breakdown voltage
drain current
input capacitance
output capacitance
subthreshold slope
mechanical characteristics
circuit density
integration level
maximum drain-source voltage
maximum power dissipation
noise margin
off-state current
gptkbp:produced_by CMOS technology
gptkbp:region current increases with voltage
current is constant
no current flows
gptkbp:symbol N-channel MOSFET symbol
gptkbp:trim_levels positive
gptkbp:type gptkb:football_match
gptkbp:water_resistance low
high