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gptkbp:instanceOf
|
Test equipment
|
|
gptkbp:advantage
|
Scalability
Interoperability
Easy integration with IT infrastructure
Lower cost of ownership
Reduced cabling complexity
|
|
gptkbp:basedOn
|
gptkb:LXI_(LAN_eXtensions_for_Instrumentation)
|
|
gptkbp:compatibleWith
|
gptkb:IEEE_1588_Precision_Time_Protocol
gptkb:SCPI_commands
gptkb:IVI_Foundation_standards
|
|
gptkbp:developedBy
|
gptkb:LXI_Consortium
|
|
gptkbp:enables
|
Remote diagnostics
Distributed test systems
Firmware updates over LAN
Synchronized measurements
|
|
gptkbp:formFactor
|
Modular
Benchtop
Rack-mountable
|
|
gptkbp:hasFeature
|
IVI drivers
Web-based configuration
Triggering over LAN
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
LXI hardware
|
|
gptkbp:introducedIn
|
2005
|
|
gptkbp:marketedAs
|
gptkb:National_Instruments
gptkb:Tektronix
gptkb:Keysight_Technologies
gptkb:Yokogawa_Electric
gptkb:Rohde_&_Schwarz
|
|
gptkbp:replacedBy
|
gptkb:VXI_hardware
GPIB hardware
PXI hardware
|
|
gptkbp:supportsProtocol
|
gptkb:Ethernet
gptkb:TCP/IP
|
|
gptkbp:usedFor
|
Data acquisition
Measurement automation
Remote instrument control
Signal generation
|
|
gptkbp:usedIn
|
Automated test systems
|
|
gptkbp:bfsParent
|
gptkb:NI_PXI_hardware
|
|
gptkbp:bfsLayer
|
7
|