Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Corporation
|
| gptkbp:developed_by |
gptkb:Corporation
|
| gptkbp:features |
advanced imaging technology
|
| gptkbp:has_product |
gptkb:Samoa
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Tonga
|
| gptkbp:is_designed_for |
wafer inspection
|
| gptkbp:is_known_for |
high precision measurements
|
| gptkbp:is_part_of |
KLA Corporation's product line
|
| gptkbp:is_used_in |
gptkb:Company
|
| gptkbp:provides |
process control solutions
|
| gptkbp:supports |
yield enhancement
|
| gptkbp:bfsParent |
gptkb:Tengu
|
| gptkbp:bfsLayer |
5
|