Statements (11)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
semiconductor devices
|
| gptkbp:category |
electronics standard
|
| gptkbp:focusesOn |
ESD sensitivity
|
| gptkbp:fullTitle |
JEDEC Standard No. 282: Test Methods and Procedures for Measuring Electrostatic Discharge (ESD) Sensitivity of Semiconductor Devices
|
| https://www.w3.org/2000/01/rdf-schema#label |
JESD282
|
| gptkbp:language |
English
|
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:purpose |
define test methods for ESD sensitivity
|
| gptkbp:bfsParent |
gptkb:JEDEC
|
| gptkbp:bfsLayer |
5
|