Statements (11)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
semiconductor devices
|
| gptkbp:category |
reliability standards
|
| gptkbp:focusesOn |
gate oxide integrity
|
| gptkbp:fullName |
JESD233: Guidelines for Gate Oxide Integrity Characterization
|
| https://www.w3.org/2000/01/rdf-schema#label |
JESD233
|
| gptkbp:publicationYear |
2014
|
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:usedBy |
semiconductor industry
|
| gptkbp:bfsParent |
gptkb:JEDEC
|
| gptkbp:bfsLayer |
5
|