Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
integrated circuits
|
| gptkbp:category |
semiconductor reliability standard
|
| gptkbp:documentType |
gptkb:International_Standard
|
| gptkbp:focusesOn |
qualification of integrated circuits
|
| gptkbp:fullTitle |
Stress-Test-Driven Qualification of Integrated Circuits
|
| https://www.w3.org/2000/01/rdf-schema#label |
JESD231
|
| gptkbp:publicationDate |
2022
|
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:purpose |
to provide a stress-test-driven approach for IC qualification
|
| gptkbp:replacedBy |
JESD47
|
| gptkbp:bfsParent |
gptkb:JEDEC
|
| gptkbp:bfsLayer |
5
|