Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scientific instrument
|
| gptkbp:application |
semiconductor testing
|
| gptkbp:feature |
precision measurements
high-frequency probing low contact resistance |
| https://www.w3.org/2000/01/rdf-schema#label |
Infinity probe
|
| gptkbp:manufacturer |
gptkb:Cascade_Microtech
|
| gptkbp:used_in |
wafer probing
RF measurements microwave measurements |
| gptkbp:usedFor |
scanning electron microscopy
|
| gptkbp:bfsParent |
gptkb:Cascade_Microtech
|
| gptkbp:bfsLayer |
8
|