IEEE International Conference on Microelectronic Test Structures
GPTKB entity
Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:conference
|
| gptkbp:abbreviation |
ICMTS
|
| gptkbp:field |
microelectronics
test structures |
| gptkbp:firstHeld |
1988
|
| gptkbp:focus |
design, fabrication, and characterization of test structures
reliability and yield of microelectronic devices |
| gptkbp:frequency |
annual
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE International Conference on Microelectronic Test Structures
|
| gptkbp:organizedBy |
gptkb:IEEE
|
| gptkbp:website |
https://ieee-icmts.org/
|
| gptkbp:bfsParent |
gptkb:IEEE_Electron_Devices_Society
|
| gptkbp:bfsLayer |
7
|