Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:professional_association
|
| gptkbp:abbreviation |
gptkb:IMS
|
| gptkbp:affiliatedWith |
IEEE Societies Council
|
| gptkbp:focus |
gptkb:Metric
metrology instrumentation |
| gptkbp:founded |
1951
|
| gptkbp:fullName |
gptkb:IEEE_Instrumentation_and_Measurement_Society
|
| gptkbp:headquartersLocation |
gptkb:Piscataway,_New_Jersey,_USA
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE IMS
|
| gptkbp:language |
English
|
| gptkbp:membership |
global
|
| gptkbp:offers |
awards
conferences standards development |
| gptkbp:organizes |
International Instrumentation and Measurement Technology Conference (I2MTC)
|
| gptkbp:parentOrganization |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:publishes |
gptkb:IEEE_Instrumentation_&_Measurement_Magazine
gptkb:IEEE_Transactions_on_Instrumentation_and_Measurement |
| gptkbp:regionServed |
worldwide
|
| gptkbp:website |
https://ieee-ims.org/
|
| gptkbp:bfsParent |
gptkb:IEEE_Instrumentation_and_Measurement_Society
|
| gptkbp:bfsLayer |
7
|