gptkbp:instance_of
|
gptkb:computer
|
gptkbp:composed_of
|
Silicon Dioxide
|
gptkbp:developed_by
|
Fujio Masuoka
Innovative Techniques
|
gptkbp:enables
|
Non-Volatile Memory
|
gptkbp:first_introduced
|
gptkb:1980s
|
gptkbp:function
|
Stores Charge
|
gptkbp:has_limitations
|
Quantum Effects
|
https://www.w3.org/2000/01/rdf-schema#label
|
Floating Gate
|
gptkbp:is_adopted_by
|
Tech Industry
|
gptkbp:is_analyzed_in
|
gptkb:engineers
Data Integrity
|
gptkbp:is_associated_with
|
Data Loss Risks
|
gptkbp:is_atype_of
|
Gate Structure
|
gptkbp:is_challenged_by
|
Scaling Issues
|
gptkbp:is_characterized_by
|
Insulation Layer
|
gptkbp:is_compared_to
|
Charge Trap
|
gptkbp:is_critical_for
|
gptkb:cloud_storage
|
gptkbp:is_designed_for
|
High Density Storage
|
gptkbp:is_discussed_in
|
Industry Conferences
|
gptkbp:is_enhanced_by
|
New Materials
|
gptkbp:is_essential_for
|
Data Retention
|
gptkbp:is_evaluated_by
|
Performance Metrics
Device Testing
|
gptkbp:is_examined_in
|
Technical Papers
|
gptkbp:is_explored_in
|
Academic Research
Research Studies
Future Applications
|
gptkbp:is_found_in
|
Memory Chips
|
gptkbp:is_fundamental_to
|
Modern Computing
|
gptkbp:is_influenced_by
|
Electric Field
|
gptkbp:is_influential_in
|
Data Storage Solutions
|
gptkbp:is_integrated_with
|
gptkb:food
Integrated Circuits
Controller Circuits
|
gptkbp:is_optimized_for
|
Low Power Consumption
|
gptkbp:is_part_of
|
gptkb:architecture
gptkb:Transistor
Data Storage Systems
|
gptkbp:is_recognized_for
|
gptkb:Performance_Efficiency
|
gptkbp:is_recommended_by
|
gptkb:Consumer_Electronics
|
gptkbp:is_regarded_as
|
Innovative Technology
|
gptkbp:is_related_to
|
Charge Trapping
|
gptkbp:is_subject_to
|
Programming Voltage
Wear Out Mechanisms
|
gptkbp:is_supported_by
|
Manufacturing Processes
Software Algorithms
|
gptkbp:is_tested_for
|
gptkb:regulations
gptkb:Reliability
|
gptkbp:is_used_in
|
EEPROM
|
gptkbp:is_utilized_for
|
gptkb:Embedded_Systems
|
gptkbp:is_utilized_in
|
gptkb:mobile_devices
Solid State Drives
NAND Flash
|
gptkbp:key
|
gptkb:Data
Memory Scaling
|
gptkbp:manufacturer
|
Semiconductor Companies
|
gptkbp:operated_by
|
Electrons
|
gptkbp:used_in
|
gptkb:memory
|
gptkbp:works_with
|
Control Gate
|
gptkbp:bfsParent
|
gptkb:2_D_NAND
|
gptkbp:bfsLayer
|
6
|