Statements (26)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:physicist
gptkb:scientist |
| gptkbp:almaMater |
gptkb:University_of_Cambridge
gptkb:University_of_Chicago |
| gptkbp:awardReceived |
gptkb:Fellow_of_the_American_Physical_Society
gptkb:Fellow_of_the_Royal_Society gptkb:Rumford_Medal gptkb:Kavli_Prize_in_Nanoscience |
| gptkbp:birthPlace |
gptkb:Prague
|
| gptkbp:dateOfBirth |
1950
|
| gptkbp:employer |
Nion Co.
|
| gptkbp:field |
physics
electron microscopy |
| https://www.w3.org/2000/01/rdf-schema#label |
Dr. Ondrej Krivanek
|
| gptkbp:knownFor |
aberration-corrected electron microscopy
development of electron energy loss spectroscopy (EELS) |
| gptkbp:memberOf |
gptkb:American_Physical_Society
gptkb:Royal_Society |
| gptkbp:nationality |
British
Czech |
| gptkbp:notableWork |
development of advanced electron microscopes
|
| gptkbp:occupation |
gptkb:physicist
|
| gptkbp:positionHeld |
President of Nion Co.
|
| gptkbp:residence |
gptkb:United_States
|
| gptkbp:bfsParent |
gptkb:Nion
|
| gptkbp:bfsLayer |
6
|