Statements (16)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:person
|
| gptkbp:degree |
gptkb:PhD
|
| gptkbp:education |
gptkb:Yale_University
gptkb:Chalmers_University_of_Technology |
| gptkbp:employer |
Nion Co.
|
| gptkbp:field |
physics
electron microscopy |
| gptkbp:founder |
Nion Co.
|
| gptkbp:knownFor |
aberration-corrected electron microscopy
|
| gptkbp:nationality |
Swedish
|
| gptkbp:occupation |
gptkb:scientist
|
| gptkbp:position |
gptkb:founder
chief technology officer |
| gptkbp:bfsParent |
gptkb:Nion
|
| gptkbp:bfsLayer |
7
|
| http://www.w3.org/2000/01/rdf-schema#label |
Dr. Niklas Dellby
|