Statements (60)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:patent
|
| gptkbp:bfsLayer |
6
|
| gptkbp:bfsParent |
gptkb:Synopsys_IP_Group
|
| gptkbp:developed_by |
gptkb:Synopsys
|
| gptkbp:enables |
Faster time-to-market
|
| gptkbp:enhances |
Product reliability
|
| gptkbp:facilitates |
Debugging and validation
|
| https://www.w3.org/2000/01/rdf-schema#label |
Design Ware Test IP
|
| gptkbp:includes |
Built-in self-test (BIST) capabilities
|
| gptkbp:integrates_with |
EDA tools
|
| gptkbp:is_aimed_at |
Semiconductor manufacturers
High-tech industries System-on-chip developers |
| gptkbp:is_available_for |
Multiple platforms
|
| gptkbp:is_available_in |
Various configurations
|
| gptkbp:is_compatible_with |
Multiple semiconductor technologies
|
| gptkbp:is_designed_for |
Low-power designs
Complex So Cs High-performance designs |
| gptkbp:is_enhanced_by |
Machine learning techniques
AI-driven analytics |
| gptkbp:is_evaluated_by |
Industry analysts
|
| gptkbp:is_integrated_with |
Synopsys Design Compiler
Synopsys HSPICE Synopsys Prime Time Synopsys VCS |
| gptkbp:is_optimized_for |
FPGA implementations
ASIC implementations |
| gptkbp:is_part_of |
Design Ware DFT solutions
Design Ware product family Synopsys DSO.ai |
| gptkbp:is_promoted_by |
Webinars
Technical papers Industry conferences Synopsys marketing |
| gptkbp:is_recognized_by |
Awards in semiconductor design
|
| gptkbp:is_supported_by |
Online forums
User community Technical support services Comprehensive documentation |
| gptkbp:is_used_for |
Design verification
|
| gptkbp:is_used_in |
gptkb:XMPP_Extension_Protocol
Consumer electronics Mobile devices Automotive applications Industrial systems |
| gptkbp:is_utilized_in |
Quality assurance
Test engineers Failure analysis Verification engineers Yield improvement Chip designers |
| gptkbp:marketed_as |
A comprehensive test solution
|
| gptkbp:offers |
Test coverage analysis
|
| gptkbp:provides |
Test automation
Test pattern generation |
| gptkbp:reduces |
Test costs
|
| gptkbp:supports |
Boundary scan testing
DFT (Design for Test) methodologies Scan testing |