Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:government_agency
|
| gptkbp:administeredBy |
gptkb:National_Institute_of_Standards_and_Technology
|
| gptkbp:announced |
2023
|
| gptkbp:country |
gptkb:United_States
|
| gptkbp:focusesOn |
semiconductor metrology
|
| gptkbp:fundedBy |
gptkb:CHIPS_and_Science_Act
|
| gptkbp:goal |
advance measurement science for semiconductors
|
| https://www.w3.org/2000/01/rdf-schema#label |
CHIPS Metrology Program
|
| gptkbp:partOf |
gptkb:CHIPS_for_America
|
| gptkbp:supports |
semiconductor manufacturing
|
| gptkbp:website |
https://www.nist.gov/chips/chips-metrology-program
|
| gptkbp:bfsParent |
gptkb:CHIPS_for_America
|
| gptkbp:bfsLayer |
7
|