Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:country |
gptkb:United_States
|
| gptkbp:division |
gptkb:Bruker_Corporation
|
| gptkbp:focusesOn |
life sciences
materials research semiconductor industry |
| gptkbp:headquartersLocation |
gptkb:San_Jose,_California
|
| gptkbp:industry |
scientific instruments
|
| gptkbp:parentCompany |
gptkb:Bruker_Corporation
|
| gptkbp:product |
atomic force microscopes
3D optical microscopes stylus profilers |
| gptkbp:specializesIn |
metrology
microscopy surface analysis |
| gptkbp:website |
https://www.bruker.com/en/products-and-solutions/surface-and-dimensional-analysis.html
|
| gptkbp:bfsParent |
gptkb:Bruker
|
| gptkbp:bfsLayer |
7
|
| https://www.w3.org/2000/01/rdf-schema#label |
Bruker Nano Surfaces
|