AOI (Automated Optical Inspection)
GPTKB entity
Statements (43)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
inspection technology
|
| gptkbp:alternativeTo |
functional testing
X-ray inspection manual visual inspection |
| gptkbp:canBe |
3D inspection
2D inspection inline system offline system |
| gptkbp:criticalFor |
high-reliability electronics
high-volume PCB production |
| gptkbp:detects |
bridges
open circuits component placement errors incorrect components missing components solder shorts soldering defects tombstoning |
| gptkbp:enables |
process optimization
traceability early defect detection |
| https://www.w3.org/2000/01/rdf-schema#label |
AOI (Automated Optical Inspection)
|
| gptkbp:improves |
manufacturing yield
|
| gptkbp:integratesWith |
manufacturing execution systems
other inspection equipment |
| gptkbp:introducedIn |
1980s
|
| gptkbp:partOf |
automated inspection systems
|
| gptkbp:reduces |
human error
production costs |
| gptkbp:relatedTo |
surface-mount technology
PCB assembly through-hole technology SMT line |
| gptkbp:requires |
gptkb:software
gptkb:LED high-resolution cameras |
| gptkbp:usedFor |
quality control
detecting defects in printed circuit boards |
| gptkbp:usedIn |
electronics manufacturing
|
| gptkbp:uses |
computer vision
optical imaging |
| gptkbp:bfsParent |
gptkb:SQ3000_Multi-Function_System
|
| gptkbp:bfsLayer |
8
|