Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
automotive applications
discrete optoelectronic semiconductors |
| gptkbp:defines |
stress test qualification for optoelectronic semiconductors
|
| gptkbp:language |
English
|
| gptkbp:officialWebsite |
https://www.aecouncil.com/Automotive_Electronics_Council_Standards.html
|
| gptkbp:publicationDate |
2022-12
|
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:replacedBy |
AEC-Q102 Rev C
|
| gptkbp:status |
active
|
| gptkbp:bfsParent |
gptkb:AEC-Q102_Rev_E
|
| gptkbp:bfsLayer |
7
|
| http://www.w3.org/2000/01/rdf-schema#label |
AEC-Q102 Rev D
|