AEC-Q100 qualification (for automotive)
GPTKB entity
Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
qualification standard
|
| gptkbp:appliesTo |
semiconductor devices
integrated circuits |
| gptkbp:definedIn |
gptkb:Automotive_Electronics_Council
|
| gptkbp:firstPublished |
1994
|
| https://www.w3.org/2000/01/rdf-schema#label |
AEC-Q100 qualification (for automotive)
|
| gptkbp:includes |
temperature cycling
moisture resistance high temperature operating life humidity testing electrostatic discharge (ESD) latch-up testing |
| gptkbp:industry |
automotive
|
| gptkbp:latestReleaseVersion |
Rev-H
|
| gptkbp:purpose |
ensure reliability of ICs in automotive applications
|
| gptkbp:region |
global
|
| gptkbp:requires |
automotive OEMs
|
| gptkbp:scope |
stress test qualification
|
| gptkbp:website |
https://www.aecouncil.com/
|
| gptkbp:bfsParent |
gptkb:EiceDRIVER_ICs
|
| gptkbp:bfsLayer |
6
|