ADC series analog-to-digital converters
GPTKB entity
Statements (49)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:microprocessor
|
| gptkbp:bfsLayer |
3
|
| gptkbp:bfsParent |
gptkb:Texas_Instruments
|
| gptkbp:application |
gptkb:Photographer
gptkb:Telecommunications_company consumer electronics industrial automation automotive systems |
| gptkbp:average_temperature |
-40 to 125 degrees Celsius
|
| gptkbp:charging_time |
varies by model
|
| gptkbp:design |
gptkb:microprocessor
|
| gptkbp:developer |
ongoing advancements in technology
|
| gptkbp:features |
high speed
low power consumption high resolution anti-aliasing filter built-in calibration programmable gain amplifier |
| gptkbp:has_documentation |
datasheets provided by manufacturers
|
| gptkbp:has_transformation |
analog signals to digital signals
|
| gptkbp:home_port |
two's complement
offset binary sign-magnitude |
| https://www.w3.org/2000/01/rdf-schema#label |
ADC series analog-to-digital converters
|
| gptkbp:input_output |
binary
|
| gptkbp:is_compared_to |
compared to other ADC architectures
|
| gptkbp:is_evaluated_by |
available for testing
|
| gptkbp:is_referenced_in |
internal or external
|
| gptkbp:is_scalable |
integral and differential
|
| gptkbp:market |
widely used in various industries
|
| gptkbp:noise_level |
low noise architecture
up to 100 d B |
| gptkbp:packaging |
BGA
TSSOP QFN |
| gptkbp:population_trend |
increasing demand for higher performance
|
| gptkbp:power_output |
single or dual supply
|
| gptkbp:produced_by |
gptkb:Analog_Devices
|
| gptkbp:range |
0 to 5 V
greater than 100 d B |
| gptkbp:recorded_by |
up to several megasamples per second
|
| gptkbp:resolution |
8-bit to 24-bit
|
| gptkbp:supports |
technical support available from manufacturers
|
| gptkbp:used_in |
data acquisition systems
|
| gptkbp:user_interface |
gptkb:I2_C
SPI parallel |
| gptkbp:water_resistance |
low
high |