Triple

T4942901
Position Surface form Disambiguated ID Type / Status
Subject IECQ E110979 entity
Predicate abbreviationOf P590 FINISHED
Object IEC Quality Assessment System for Electronic Components E110979 NE FINISHED

How this triple was built (2 steps)

Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.

NER Named-entity recognition gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: IEC Quality Assessment System for Electronic Components | Statement: [IECQ, abbreviationOf, IEC Quality Assessment System for Electronic Components]
NED1 Entity disambiguation (via context triple) gpt-5-mini-2025-08-07
Target entity: IEC Quality Assessment System for Electronic Components
Context triple: [IECQ, abbreviationOf, IEC Quality Assessment System for Electronic Components]
  • A. IECQ chosen
    IECQ is the IEC Quality Assessment System for Electronic Components, a global certification scheme that ensures the quality and reliability of electronic components and related materials.
  • B. IEC 62680
    IEC 62680 is an international standard that defines the Universal Serial Bus (USB) interface and related specifications for electronic devices.
  • C. IEEE 1500 embedded core test standard
    The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
  • D. IEEE 1149 family of standards
    The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
  • E. IEEE Std 610.12-2010
    IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
  • F. None of above.
  • G. Unsure - the case is ambiguous/there is not enough information to decide.

Provenance (3 batches)

The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.

Step Stage Batch ID Status When
creating Elicitation batch_69bd441721cc819085c7e33fe0876818 completed March 20, 2026, 12:56 p.m.
NER Named-entity recognition batch_69bd70a5f56481908365d0fe16892bf4 completed March 20, 2026, 4:07 p.m.
NED1 Entity disambiguation (via context triple) batch_69be81cc862081908b42686f04915238 completed March 21, 2026, 11:32 a.m.
Created at: March 20, 2026, 1:31 p.m.