Triple

T2424348
Position Surface form Disambiguated ID Type / Status
Subject IEEE 1149 family of standards E53490 entity
Predicate includes P1393 FINISHED
Object IEEE 1149.1
IEEE 1149.1 is a widely used JTAG boundary-scan standard that defines a method for testing and debugging integrated circuits and printed circuit boards via a dedicated serial test access port.
E53490 NE FINISHED

How this triple was built (4 steps)

Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.

NER Named-entity recognition gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: IEEE 1149.1 | Statement: [IEEE 1149 family of standards, includes, IEEE 1149.1]
NED1 Entity disambiguation (via context triple) gpt-5-mini-2025-08-07
Target entity: IEEE 1149.1
Context triple: [IEEE 1149 family of standards, includes, IEEE 1149.1]
  • A. IEEE 1149 family of standards
    The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
  • B. IEEE 1149.4
    IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.
  • C. IEEE 1149.7
    IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
  • D. IEEE 1149.6
    IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
  • E. IEEE 1149.10
    IEEE 1149.10 is a JTAG-related IEEE standard that defines high-speed test access mechanisms for embedded instrumentation and system-level testing of complex digital devices and boards.
  • F. None of above. chosen
  • G. Unsure - the case is ambiguous/there is not enough information to decide.
NEDg Description generation gpt-5.1
Instruction
Generate a one-sentence description of the target entity. 
You are given a context triple in the form (subject, predicate, object), where the object is the target entity. 
# Instructions
Use the triple to infer relevant information about the entity. Describe the entity based on what is most defining, well-known. 
Avoid repeating the information from the triple, unless really essential.
# Response Format
Return only the sentence: "Description: [one-sentence description of the target entity]"
Input
Entity: IEEE 1149.1
Triple: [IEEE 1149 family of standards, includes, IEEE 1149.1]
Generated description
IEEE 1149.1 is a widely used JTAG boundary-scan standard that defines a method for testing and debugging integrated circuits and printed circuit boards via a dedicated serial test access port.
NED2 Entity disambiguation (via description) gpt-5-mini-2025-08-07
Target entity: IEEE 1149.1
Target entity description: IEEE 1149.1 is a widely used JTAG boundary-scan standard that defines a method for testing and debugging integrated circuits and printed circuit boards via a dedicated serial test access port.
  • A. IEEE 1149 family of standards chosen
    The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
  • B. IEEE 1149.4
    IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.
  • C. IEEE 1149.7
    IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
  • D. IEEE 1149.6
    IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
  • E. IEEE 1149.10
    IEEE 1149.10 is a JTAG-related IEEE standard that defines high-speed test access mechanisms for embedded instrumentation and system-level testing of complex digital devices and boards.
  • F. None of above.

Provenance (5 batches)

The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.

Step Stage Batch ID Status When
creating Elicitation batch_69ab495c44d48190b7235b23719bc3f6 completed March 6, 2026, 9:38 p.m.
NER Named-entity recognition batch_69abc973aee08190b543492f436f3fe5 completed March 7, 2026, 6:45 a.m.
NED1 Entity disambiguation (via context triple) batch_69aebf5e33208190a6899e6672b3daeb completed March 9, 2026, 12:38 p.m.
NEDg Description generation batch_69aec590516c81908f5126e203bb3638 completed March 9, 2026, 1:05 p.m.
NED2 Entity disambiguation (via description) batch_69aec6194a3c81909055a16553f39e78 completed March 9, 2026, 1:07 p.m.
Created at: March 6, 2026, 9:42 p.m.