gptkbp:instance_of
|
gptkb:scientific_experiments
|
gptkbp:application
|
gptkb:nanotechnology
gptkb:Biology
Material science
Semiconductor inspection
|
gptkbp:benefits
|
Costly equipment
High magnification
Complex operation
Detailed imaging
Sample preparation required
|
gptkbp:components
|
gptkb:cosmic_ray_detector
Lenses
Electron gun
Vacuum chamber
|
gptkbp:developed_by
|
gptkb:Ernst_Ruska
|
gptkbp:field_of_use
|
gptkb:Industry
gptkb:research
gptkb:Education
|
gptkbp:first_commercial_model
|
1950s
|
https://www.w3.org/2000/01/rdf-schema#label
|
scientific experiments
|
gptkbp:image_format
|
3 D images
2 D images
|
gptkbp:image_formation
|
Electron diffraction
Secondary electrons
Backscattered electrons
|
gptkbp:invention
|
1931
|
gptkbp:involved_technology
|
gptkb:Atomic_Force_Microscope
gptkb:Scanning_Tunneling_Microscope
X-ray microscopy
|
gptkbp:maintenance
|
Regular calibration
Vacuum system checks
Lens cleaning
|
gptkbp:notable_users
|
gptkb:Companies
gptkb:researchers
Universities
|
gptkbp:resolution
|
Higher than light microscopes
|
gptkbp:sampled_in
|
gptkb:nanotechnology
Biological samples
Metal samples
Polymer samples
|
gptkbp:training
|
Safety training
Operator training
Sample preparation training
|
gptkbp:trends
|
Automation
Portability
Integration with AI
Improved resolution
|
gptkbp:type
|
gptkb:Scanning_Electron_Microscope
gptkb:Transmission_Electron_Microscope
|
gptkbp:uses
|
Electron beams
|
gptkbp:viewfinder_type
|
Up to 10 million times
|
gptkbp:bfsParent
|
gptkb:The_Invisible_Man
gptkb:Charles_Darwin
gptkb:Yoshinori_Ohsumi
gptkb:Hanford
gptkb:NASA
gptkb:camera
gptkb:Edison_light_bulb
gptkb:The_First_Men_in_the_Moon:_A_Story_of_the_Year_1901
gptkb:The_Food_of_the_Gods_and_How_It_Came_to_Earth
|
gptkbp:bfsLayer
|
3
|