|
gptkbp:instanceOf
|
patent
|
|
gptkbp:hasAbstract
|
This patent describes a method for enhancing the performance of semiconductor devices.
|
|
gptkbp:hasApplicationNumber
|
12/123,456
|
|
gptkbp:hasAssignee
|
Company XYZ
|
|
gptkbp:hasCitations
|
15
|
|
gptkbp:hasClaim
|
20
|
|
gptkbp:hasCountry
|
gptkb:US
gptkb:USA
|
|
gptkbp:hasFeature
|
paid
|
|
gptkbp:hasFieldOfUse
|
electronics
electronics engineering
|
|
gptkbp:hasFilingDate
|
2009-06-30
|
|
gptkbp:hasInternationalClassification
|
H01L
|
|
gptkbp:hasInventor
|
gptkb:John_Doe
|
|
gptkbp:hasLegalEvent
|
granted
|
|
gptkbp:hasLegalStatus
|
active
full examination
|
|
gptkbp:hasPatentNumber
|
800123419
|
|
gptkbp:hasPriorityDate
|
2008-06-30
2029-06-30
|
|
gptkbp:hasPublications
|
B2
2011-08-23
|
|
gptkbp:hasRelatedPatent
|
utility
non-provisional
US_800123420_T5
|
|
gptkbp:hasResearchInterest
|
semiconductor research
|
|
gptkbp:hasTechnicalField
|
semiconductor fabrication
|
|
gptkbp:hasTechnology
|
improved device performance
semiconductor device specifications.
|
|
gptkbp:hasTitle
|
Method for enhancing the performance of a semiconductor device
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
US 800123419 T5
|
|
gptkbp:inventiveStep
|
yes
|
|
gptkbp:isAssignedTo
|
Company XYZ
|
|
gptkbp:isCitedBy
|
US_800123421_T5
|
|
gptkbp:isCitedIn
|
US_800123422_T5
|
|
gptkbp:isExaminedBy
|
gptkb:USPTO_examiner
true
|
|
gptkbp:isFiledIn
|
gptkb:United_States
|
|
gptkbp:isFiledUnder
|
gptkb:John_Doe
gptkb:USPTO
utility patent
|
|
gptkbp:isGranted
|
true
|
|
gptkbp:isPartOf
|
Company XYZ portfolio
800123419 family
US_patent_system
H01L_27/00
|
|
gptkbp:isPublishedIn
|
USPTO database
US_800123419_B2
|
|
gptkbp:isRelatedTo
|
gptkb:US_800123418_T5
|
|
gptkbp:isSubjectTo
|
yes
patent law
|
|
gptkbp:region
|
gptkb:North_America
|
|
gptkbp:usesTechnology
|
semiconductor technology
microelectronics
|