|
gptkbp:instanceOf
|
patent
|
|
gptkbp:hasAbstract
|
A method for improving semiconductor device performance.
|
|
gptkbp:hasAssignee
|
gptkb:XYZ_Corporation
|
|
gptkbp:hasCitations
|
15
|
|
gptkbp:hasClaim
|
20
|
|
gptkbp:hasDescription
|
This patent describes a novel approach to semiconductor fabrication.
|
|
gptkbp:hasFeature
|
paid
|
|
gptkbp:hasFieldOfUse
|
yes
electronics
|
|
gptkbp:hasFilingDate
|
2004-02-06
|
|
gptkbp:hasInternationalClassification
|
H01L
|
|
gptkbp:hasInventor
|
gptkb:John_Doe
|
|
gptkbp:hasLegalEvent
|
expired
granted
assigned
renewed
reinstated
|
|
gptkbp:hasLegalStatus
|
active
|
|
gptkbp:hasMember
|
5
|
|
gptkbp:hasPriorityDate
|
2024-02-06
2003-02-06
|
|
gptkbp:hasPublications
|
2004-09-14
|
|
gptkbp:hasRelatedPatent
|
gptkb:US_6,789,941_S27
gptkb:US_6,789,939_S27
|
|
gptkbp:hasTechnicalField
|
microelectronics
|
|
gptkbp:hasTechnology
|
not available
available
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
US 6,789,940 S27 family
|
|
gptkbp:inventiveStep
|
yes
|
|
gptkbp:isCitedBy
|
gptkb:US_7,123,456
gptkb:US_7,654,321
|
|
gptkbp:isExaminedBy
|
no
yes
|
|
gptkbp:isFiledIn
|
gptkb:United_States
|
|
gptkbp:isFiledUnder
|
gptkb:USPTO
|
|
gptkbp:isPartOf
|
S27_family_of_patents
|
|
gptkbp:isPublishedIn
|
USPTO database
|
|
gptkbp:isRelatedTo
|
gptkb:US_6,789,941
US_6,789,939
|
|
gptkbp:isSubjectTo
|
examination
licensing agreements
litigation
appeal
opposition
|
|
gptkbp:usesTechnology
|
semiconductor manufacturing
|