Statements (18)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Company
|
| gptkbp:employs |
gptkb:engineers
|
| gptkbp:founded |
gptkb:1997
|
| gptkbp:headquarters |
gptkb:Barcelona
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Spain
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:location |
gptkb:Spain
|
| gptkbp:offers |
Inspection Systems
Metrology Systems Yield Management Solutions |
| gptkbp:parent_company |
gptkb:Corporation
|
| gptkbp:part_of |
gptkb:Corporation
|
| gptkbp:serves |
Global Semiconductor Industry
|
| gptkbp:website |
www.kla.com
|
| gptkbp:bfsParent |
gptkb:KLA-Tencor_Holdings
gptkb:KLA-Tencor_Corporation gptkb:KLA-Tencor_Technologies |
| gptkbp:bfsLayer |
6
|