Properties (38)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Company
|
| gptkbp:acquisition |
Acquired_by_KLA_Corporation_in_2016
|
| gptkbp:awards |
Industry recognition awards
|
| gptkbp:communityEngagement |
Local community initiatives
|
| gptkbp:customerSupport |
Technical support services
|
| gptkbp:employees |
Approximately 500
|
| gptkbp:events |
Participation in semiconductor conferences
|
| gptkbp:focus |
Advanced semiconductor manufacturing
|
| gptkbp:founded |
1997
|
| gptkbp:globalPresence |
Offices in multiple countries
|
| gptkbp:headquarters |
gptkb:Spain
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Spain
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:innovation |
Focus_on_R&D
|
| gptkbp:keyIssues |
Leading semiconductor manufacturers
|
| gptkbp:leadership |
Experienced management team
|
| gptkbp:location |
gptkb:Barcelona
|
| gptkbp:market |
Global semiconductor market
|
| gptkbp:marketShare |
Significant share in semiconductor equipment market
|
| gptkbp:mission |
Delivering innovative solutions for customers.
|
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:partnerships |
Collaborations with research institutions
|
| gptkbp:partOf |
gptkb:KLA_Corporation
|
| gptkbp:patentCitation |
Numerous patents in semiconductor technology
|
| gptkbp:products |
Inspection systems
Metrology systems |
| gptkbp:research |
Collaboration with universities
|
| gptkbp:revenue |
Part of KLA Corporation's revenue
|
| gptkbp:services |
Process control and yield management
|
| gptkbp:sustainability |
Commitment to sustainable practices
|
| gptkbp:technology |
Defect review
E-beam inspection Overlay metrology Thin film metrology Wafer inspection |
| gptkbp:training |
Employee training programs
|
| gptkbp:vision |
Leading the future of semiconductor manufacturing
|
| gptkbp:website |
www.kla.com
|