Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Company
|
| gptkbp:founded |
gptkb:1997
|
| gptkbp:headquarters |
gptkb:New_Zealand
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor New Zealand
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:parent_company |
gptkb:Corporation
|
| gptkbp:part_of |
gptkb:Corporation
|
| gptkbp:services |
Inspection Equipment
Metrology Equipment |
| gptkbp:target_market |
Semiconductor Manufacturers
|
| gptkbp:website |
www.kla.com
|
| gptkbp:bfsParent |
gptkb:Tengu
|
| gptkbp:bfsLayer |
5
|