|
gptkbp:instance_of
|
gptkb:product
|
|
gptkbp:application
|
Wafer Inspection
|
|
gptkbp:benefits
|
Cost Reduction
Enhanced Performance
Increased Yield
|
|
gptkbp:category
|
Semiconductor Equipment
|
|
gptkbp:compatibility
|
Various Wafer Sizes
|
|
gptkbp:features
|
Real-time Data Processing
High Sensitivity
Automated Analysis
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
KLA-Tencor Monaco
|
|
gptkbp:input_output
|
Statistics
Reports
Graphs
|
|
gptkbp:installation
|
Remote Installation
On-site Installation
|
|
gptkbp:interface
|
User-friendly GUI
|
|
gptkbp:language_support
|
gptkb:French
gptkb:Italian
gptkb:Japanese
gptkb:Korean
gptkb:Spanish
gptkb:German
gptkb:Portuguese
gptkb:Russian
Chinese
English
|
|
gptkbp:manufacturer
|
gptkb:Corporation
|
|
gptkbp:market
|
Global Semiconductor Market
|
|
gptkbp:operating_system
|
gptkb:Windows
|
|
gptkbp:regulatory_compliance
|
gptkb:ISO_9001
gptkb:CE_Marking
REACH Compliant
Ro HS Compliant
|
|
gptkbp:related_to
|
gptkb:Quality_Assurance
Process Control
Semiconductor Manufacturing
Defect Detection
|
|
gptkbp:release_year
|
gptkb:2015
|
|
gptkbp:successor
|
KLA-Tencor AIT
|
|
gptkbp:support
|
24/7 Technical Support
|
|
gptkbp:technology
|
Optical Inspection
|
|
gptkbp:training
|
Available
|
|
gptkbp:user_base
|
Research Institutions
Universities
Manufacturers
Semiconductor Companies
Foundries
|
|
gptkbp:uses
|
gptkb:machine_learning
|
|
gptkbp:bfsParent
|
gptkb:KLA-Tencor_Holdings
gptkb:KLA-Tencor_Corporation
gptkb:KLA-Tencor_Technologies
|
|
gptkbp:bfsLayer
|
6
|