Properties (49)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Product
|
| gptkbp:application |
Process Control
Defect Detection Wafer Inspection |
| gptkbp:availableIn |
gptkb:Asia
gptkb:North_America Europe |
| gptkbp:benefits |
Quality Improvement
Cost Reduction Increased Yield |
| gptkbp:category |
Metrology Equipment
|
| gptkbp:competitors |
gptkb:Nikon
gptkb:ASML Applied Materials |
| gptkbp:customerSupport |
Training Services
24/7 Technical Support Maintenance_Services |
| gptkbp:features |
High Sensitivity
Automated Analysis Advanced Inspection |
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Monaco
|
| gptkbp:innovation |
Collaboration with Universities
Customer Feedback Integration Continuous_Development |
| gptkbp:market |
gptkb:Global_Semiconductor_Market
|
| gptkbp:operatingHours |
Proprietary Software
|
| gptkbp:partOf |
KLA's_Product_Line
|
| gptkbp:producedBy |
gptkb:KLA_Corporation
|
| gptkbp:regulatoryCompliance |
gptkb:ISO_9001
RoHS Compliance CE Marking |
| gptkbp:relatedTo |
Process Optimization
Defect Reduction Yield Management |
| gptkbp:releaseYear |
2015
|
| gptkbp:sisterCity |
Distributors
Direct Sales Online_Sales |
| gptkbp:supports |
Automated Reporting
Real-time Monitoring Multiple Wafer Sizes Data_Analytics |
| gptkbp:technology |
Image Processing
Machine Learning Optical Inspection |
| gptkbp:usedFor |
Semiconductor Manufacturing
|
| gptkbp:userBase |
Research Institutions
Semiconductor Manufacturers Foundries |