Properties (37)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Company
|
| gptkbp:acquisition |
gptkb:KLA_Corporation
|
| gptkbp:awards |
Industry recognition
|
| gptkbp:communityEngagement |
Local community initiatives
|
| gptkbp:competitors |
gptkb:Lam_Research
gptkb:ASML Applied Materials |
| gptkbp:customerBase |
Global semiconductor manufacturers
|
| gptkbp:employees |
Over 1,000
|
| gptkbp:events |
Participates in trade shows
|
| gptkbp:focus |
Advanced technology solutions
|
| gptkbp:focusArea |
Yield_management
|
| gptkbp:founded |
1997
|
| gptkbp:headquarters |
Europe
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Europe
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:innovation |
Leading in semiconductor technology
|
| gptkbp:keyPeople |
CEO
|
| gptkbp:location |
Various_locations_in_Europe
|
| gptkbp:market |
Semiconductor industry
|
| gptkbp:mission |
To provide advanced process control solutions.
|
| gptkbp:operatesIn |
Global market
|
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:partnerships |
Various technology companies
|
| gptkbp:partOf |
gptkb:KLA_Corporation
|
| gptkbp:products |
Metrology systems
Defect review systems Wafer inspection systems |
| gptkbp:researchAndDevelopment |
Significant investment
|
| gptkbp:revenue |
Billions of dollars
|
| gptkbp:services |
Inspection and metrology equipment
|
| gptkbp:subsidiary |
gptkb:KLA_Corporation
|
| gptkbp:sustainability |
Commitment to sustainable practices
|
| gptkbp:technology |
Cutting-edge technology
|
| gptkbp:trainingPrograms |
Employee development programs
|
| gptkbp:vision |
To enable innovation in the semiconductor industry
|
| gptkbp:website |
www.kla.com
|